XCC offers:

  XCC brochure

• State-of-the-Art X-ray Diffraction Instrumentation
• High-Quality Service and Competitive Rates
• Extensive Experience and Expertise

  XCC News:

1. Photonic Laue back scattering system:
   - determiantion of the orientation of crystals and grains.
     
   

2. Bruker D8 Venture Duo single crystal diffractometer: 
   - dual microsource: Cu and Mo radiations, 
   - N-Helix low-temp. system (down to 20K). 
     

3. Our New Location in Wing 5 (MAP).

4. Book on Powder Diffraction, Third Edition (coming soon).

  and performs:

1. Non-destructive characterization of materials using X-ray diffraction (XRD) techniques

2. Crystal structure determination from single-crystal and polycrystalline samples

3. Orientation of crystals and determination of crystallite/grain orientaions

4. X-ray reflectivity (XRR) and pole figure measurements

5. Small-angle X-ray scattering (SAXS) of polymers, proteins, and nanomaterials

  Chemical Crystallography:

• Provides single-crystal structure determination for a wide range of materials, including inorganic, metal-organic, organic, pharmaceutical compounds, minerals, and intermetallics.

• Capabilities include: absolute structure determination; handling merohedral and non-merohedral twins; analysis of disordered, OD, and modulated crystals; measurements at low (donw to 20K), ambient or elevated (up to 1200 K) temperature working in open or inert atmosphere

  Materials Characterization:

Provides powder X-ray diffraction analysis and characterization of polycrystalline and nano-crystalline materials and thin films. Service include:

• phase identification, qualitative, semi-quantitative, and quantitative analysis;

• determination of the degree of crystallinity / amorphous content determination;

• micro-diffraction and area mapping;

• analysis of samples of any size and shape;

• crystallite size and micro-strain determination, and more

Elucidates crystallographic and structural information, including:

• as ab initio indexing and high-precision unit cell determination;

• crystal structure refinement using the Rietveld or pair distribution function;

• ab initio structure determination from powder diffraction data

  Advanced Diffraction:

• provides advanced X-ray diffraction measurements of reflectivity (XRR) from thin films using small angle X-ray scattering (SAXS/WAXS/GISAXS) with the Xeuss system for proteins, polymers and nanomaterials

• crystal and crystallite (crystal grain) orientation determination using Laue backscattering system

  The Center also

• offers its equipment and expertise for Collaborative research with local universities, government institution, startups, as well as industry located in Maryland, Virginia, Delaware, Washington DC, and across the nation

• provides Consulting in the field of: X-ray diffraction and crystallography; solid-state and materials chemistry; forensic analysis; materials characterization; pharmaceuticals; patents, legal issues; and other specialized areas